Description
| Description and Traceability | 65 μm polystyrene film in a card holder. Traceable to NIST SRM 1921b and NIST SRM 2065. Supplied complete with UKAS ISO/IEC 17025 accredited certificate of calibration. |
| Primary Usage | Qualification of the wavelength scale of mid- and near infrared FTIR spectrophotometers. |
| Useable Range | 540 cm-1 to 9000 cm-1 (1.1 μm to 18.5 μm). |
| Wavenumber Resolution | 2 cm-1 or better |
| Certified Wavelengths | 539, 842, 907, 1028, 1069, 1155, 1583,1601, 1943, 2849, 3001, 3026, 3060, and 3082 cm-1 (Mid IR); 3064, 3647, 4039, 4250, 4335, 4608, 5952, 8749 cm-1 (Near IR) |
| Physical Configuration | Polystyrene film mounted in card holder compatible with the sample holders of most infrared spectrophotometers |
Product Description:
Polystyrene film has been a popular wavelength reference for infrared spectrometers for many years. These new NIST-traceable Starna Reference Materials can be used to qualify Mid IR and Near IR-FTIR spectrophotometers for wavelength accuracy over the range 540 cm-1 to 9000 cm-1 (1.1 μm to 18.5 μm).
14 certified peaks, traceable to NIST SRM 1921b, are available for wavelength qualification purposes in the mid infrared. Approximate peak wavelength values are:
539, 842, 907, 1028, 1069, 1155, 1583,1601, 1943, 2849, 3001, 3026, 3060, and 3082 cm-1.
In addition, eight peaks, traceable to NIST SRM 2065, can be used for wavelength qualification in the near infrared. Approximate peak wavelength values are:
| cm-1 | 3064 | 3647 | 4039 | 4250 | 4335 | 4608 | 5952 | 8749 |
| nm | 3264 | 2742 | 2476 | 2353 | 2307 | 2170 | 1680 | 1143 |
Suggestions for Use:
The instrument to be qualified should have a wavenumber resolution of 2 cm-1 or better. Scan the filter over its usable range and identify the peaks whose wavelength values are given in the calibration certificate. Compare the measured values to the certificate values. Taking the expanded uncertainty budget† of the references into consideration, then the wavelength values should fall within the expected parameters† of your instrument if it is working correctly.
The results may be used to build up a data log of the instrument’s wavelength accuracy over time. This may be used for certification purposes and for troubleshooting should the correlation change. The data will also be useful to a service technician to diagnose and correct any problems that may develop with your instrument.
† Expected Parameters and Expanded Uncertainty Budget
The expanded uncertainty budget (k=2) is the tolerance that we could expect to measure in the assigned value on any one of our reference spectrophotometers during the 2 year period of certification.
When used to verify the performance of any given spectrophotometer this certificate tolerance must be added in a simple linear manner to the stated appropriate specification accuracy of the instrument on the test, see following example:
| Wavelength | Absorbance | |
| Certificate | ±0.10 nm | ±0.0049 A |
| Instrument | ±0.30 nm | ±0.0050 A |
| Total | ±0.40 nm | ±0.0099 A |
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