(QR230-7-XSR) 235 µm Extreme-Solarization-Resistant Premium Reflection Probe, 2 m


Price:
Sale price$819.85

Description

A reflection/backscatter probe is a compact, versatile sampling option to measure diffuse and specular reflectance, backscatter, or fluorescence from samples as varied as solids, solutions, and powders. Reflection and backscatter measurements can provide quantitative information about the color, appearance, and chemical composition of a sample.

General purpose — ideal for diffuse or specular reflectance from solids; fluorescence; color

XSR fibers — probe assembly comprises extreme solarization-resistant fibers (180-800 nm)

Probe design — 6-around-1 fiber bundle design, with 6-fiber leg connecting to light source and single-fiber leg connecting to spectrometer

QR230-7-XSR QR450-7-XSR
Wavelength Range 180nm - 800nm 180nm - 800nm
Fiber Core Size 230 µm 450 µm
Length 2 m 2 m
Jacket Silicone-coated steel monocoil Silicone-coated steel monocoil
Probe Ferrule Diameter 6.35 mm (1/4″) 6.35 mm (1/4″)
Breakout Midway point of assembly at 1 meter Midway point of assembly at 1 meter
Buffer Materials Aluminum
Polymer
Aluminum
Nylon
Silicone
Cladding OD 250 µm 500 µm
Cladding OD Tolerance ± 13 µm ± 25 µm
Connector SMA 905 SMA 905
Fiber Core Size Tolerance ± 12 μm ± 22 μm
Long Term Bend Radius 4 cm 8 cm
Maximum OD 380 µm 1300 µm
Maximum OD Tolerance ± 20 µm ± 100 µm
Primary Buffer OD 300 µm 580 µm
Probe Fiber Bundle 6 illumination fibers around 1 read fiber 6 illumination fibers around 1 read fiber
Short Term Bend Radius 2 cm 4 cm
Probe Ferrule Length 76.2 mm (3″) 76.2 mm (3″)
Probe Ferrule Material Stainless steel Stainless steel
Operating Temperature (-50) to 80 °C (-50) to 80 °C

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