(STAN-SSH) PN A338-MS-1 Specular Reflectance Standard, High Reflectivity


Price:
Sale price$611

Description

Ocean Insight offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings.

The STAN-SSH varies in reflectivity from 85%-98% over the 250-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2400 nm.

Specular reflectance – high specular reflectivity (85%-98% over the 250-2500 nm)

Calibrated standard – NIST-traceable version also available

Convenient holder – optional accessory holds standard in place

STAN-SSH STAN-SSH-NIST STAN-SSL WS-1 WS-1-SL
Reflectance Material Front surface-protected aluminum mirror on fused silica substrate Front surface-protected aluminum mirror on fused silica substrate Schott ND9 glass
Diffusing Material PTFE Spectralon
Reflectivity ~87%-93% (200 - 1000 nm)
~93%-98% (1000 - 2500 nm)
~87%-93% (200 - 1000 nm)
~93%-98% (1000 - 2500 nm)
~5% (200 - 950 nm)
~4% (950-2500 nm)
>98% (250-1500 nm)
>95% (250-2200 nm)
99% (400-1500 nm)
>96% (250-2000 nm)
Spectral Range 200-2500 nm 200-2500 nm 200-2500 nm 250-2000 nm 250-2000 nm
Housing Material Alumimum Delrin
Dimensions (Housing) 38 mm outer diameter x 19 mm height 38 mm outer diameter x 19 mm height 38 mm outer diameter x 19 mm height 38 mm diameter (housing) 32 mm OD
10 mm thick (tile)
Dimensions (Substrate) 31.75 mm outer diameter x 6.35 mm height 31.75 mm outer diameter x 6.35 mm height 31.75 mm outer diameter x 6.35 mm height 10 mm thick
Weight 40 g 40 g 40 g 30 g 30 g

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